Recent content by jmccann

Our 3D scopes should be accurate enough. The measurement will not be recurrent enough to warrant the set up of a gauge system.

This part is not doable on the CMM. The features are far too small for the probe, and the pins will permanently bend under the pressure of the probe.

Attached the image with the surface profile call out http://files.engineering.com/getfile.aspx?folder=94c3959c-5761-4e06-9cef-46ba3d141355&file=Capture.PNG

I have a microprocessor and a surface profile call out pointing to the bottom surface of one of the pins. There are 48 total pins. I understand the theory of what surface profile is (somewhat), but I'm unsure on how to measure it. We do have a microscope scanner that can produce 3d height map...

Bumping. Still one question unanswered. On the Positional feature frame with only Datum Feature "D" called out what am I actually measuring? There is no basic dimension to use there.

Thanks for the help. One thing though, the positional call out with lots of datum features is solved, but the second positional call out still doesn't have a basic dimension to use with it. Am I really supposed to do parallelism measurement of one exterior pin tip to the opposite exterior pin...

I'm a lowly measurement technician. They sent me to GD&T training, but it was mostly about theory and applying the principles when drafting up a design drawing. None that helps much when trying to actually measure things using GD&T. There's no one around for me to ask for help, so I'm coming to...