Accelerated Test Factors - not Semicon related

[MarkRAMS]

I have found much written on the accelerated testing of Semiconductor devices, however, I am investigating the accelerated testing of a complete electro-mechanical system.

Does anyone have information on Temperature related acceleration factors for mechanical test applications?

Many thanks for your replies.

Mark

 

[m777182]

Temperature accelerates chemical decomposition and its effect will be most easily detected on polymeric materials: isolation, printed boards,connectors, housing. There are instruments that measure changes of materials due to temperature changes (cycles). They actually measure the elastic modulus at different frequencies after many temperature cycles. The method is called Dynamic Mechanic Thermal Analysis or DMTA. Use these key words and google.
I cannot say anything about criteria.
m777182

 

[IRstuff]

You might also look at "physics of failure" and prognostics. There are a lot of people working in the prediction of failures from mechanical stress. Temperature cycling, vibration, shock, etc.

TTFN